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In-Circuit Tester TRI ICT TR5001V SII SERIES
Product Specification
	 
 
	
 
	In-Circuit Tester TRI ICT TR5001V SII SERIES
 
Top-of-the-line multi-core parallel vacuum ICT+FCT solution. TR5001V SII Series offers breakthrough performance with up to 4 independent cores for high throughput. Includes durable Quick Disconnect Interface together with built-in auto-calibration and self-diagnostics ensure long-term testing reliability. TR5001V SII Series is powered by TRI's flow-based Smart Programming Software for ease of use.
	• Multi-Core Parallel Test 
						Tester Specifications 
					 
						Analog/hybrid test points 
					 
						TR5001QV SII: 4096 
					 
						TR5001DV SII: 3328 
					 
						TR5001V SII: 3456 
					 
						Operating System 
					 
						Microsoft® Windows compatible PC with USB, Windows 10 
					 
						Fixture Type 
					 
						Vacuum fixture with Quick Disconnection InterfaceStandard Testing Components 
					 
						Standard Testing Components 
					 
						Analog Test Hardware 
					 
						6-wire measurement switching matrix 
					 
						Programmable AC/DC/DC High voltage and current sources 
					 
						AC/DC voltage, DC current measurement 
					 
						Component R/L/C measurement 
					 
						Optional Components 
					 
						Analog Hardware 
					 
						TestJet vectorless open circuit detection 
					 
						Arbitrary Waveform Generator 
					 
						Digital Testing 
					 
						Non-multiplexing 1:1 per pin architecture with independent per-pin level setting 
					 
						Serial Test Controller (STC) Programming 
					 
						DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A 
					 
						DPS Programmable DUT Power supply : 
					 
						(1) DPS3514: 30Vmax/5Amax/100Wmax per channel /4CH per DPS 
					 
						(2) DPS3122: 30Vmax/10Amax/200Wmax per channel /2CH per DPS 
					 
						Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power 
					 
						Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test 
					 
						Up to 8 High Speed Serial Ports, On-board Flash, EEPROM, MAC programming 
					 
						Yield Management System 
					 
						YMS 4.0 
					 
						Dimensions 
					 
						WxDxH 
					 
						900 x 1080 x 1270 mm 
					 
						Weight 
					 
						TR5001QV SII: 370 kg 
					 
						TR5001DV SII: 350 kg 
					 
						TR5001V SII: 350 kg 
					
• Reliable Vacuum Fixture Testing
• Non-Multiplexing 1:1 per Pin Architecture
• Scalable MDA to ICT and Functional Test
• High Accuracy and High Throughput
• Durable Quick Disconnection Interface
	
		
			
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Contact: Mr Tommy
Phone: +86 13691605420
Tel: +86 -755-85225569
Email: tommy@flason-smt.com
Add: 94#,Guangtian Road,Songgang Street,Bao an District Shenzhen China